Date: 25 September 2017 Venue: CEA Leti Agenda: Elena Dilonardo (CNR-Italy): ‘Analysis and Visualization of Materials by X-ray nano-Computed Tomography (nano-CT)’ and ‘Laboratory Information Metrology Management System’ (via Skype entreprise) Carlos Beitia (CEA): ‘Die level topography traceability measurements challenges’ José Moran (LNE): ‘Combined AFM/STM microscopy based on a quartz tuning fork sensor: surface morphology and… Read More