Advanced 3D chemical metrology for innovative technologies

Metrology for Manufacturing 3D Stacked Integrated Circuits

We aim to support future primary electrical metrology based on single-electron devices

Metrology for innovative nanoparticles (14IND12)

Metrology for 5G communications

Metrology for Highly Parallel Manufacturing

Developing urgently needed new metrological capabilities

Optical metrology for quantum-enhanced secure telecommunication. This project follows on from MIQC.

Optical clocks with 1 x 10^-18 uncertainty

Standard Tests and Requirements for Rate-of-Change of Frequency (ROCOF) Measurements in Smart Grids

Metrology for length-scale engineering of materials

Metrology for sampling and conditioning SO2 emissions from stacks