The ISO GScope consortium is working with international experts from NIM China to help develop international standards in the measurement of graphene oxide.

At the recent ISO TC229 (nanotechnologies) meeting the measurement and characterisation working group (JWG2) agreed to launch a new work item ballot on ISO/PWI 23879 ‘Nanotechnologies – Structural characterisation of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM’.  This document is led by LingLing Ren, NIM, China with a co-lead of Charles Clifford, NPL, UK.