• Madsen M and Hansen P, 2016, Scatterometry — fast and robust measurements of nano-textured surfaces, Surface Topography: Metrology and Properties4, 023003
  • Madsen M, Boher P, Hansen P and Jørgensen J, 2016, Alignment-free characterization of 2D gratings, Applied Optics, 55, 317
  • Madsen JS, Hansen P-E, Bilenberg B, Nygård J and Madsen MH, 2016, Measuring multiple nano-textured areas simultaneously with imaging scatterometry, Proc. euspen 16th Intl. Conf., Nottingham, UK, 30 May – 3 June
  • Jones C, Santiano M, Downes S, Bellotti R, O’Connor D and Picotto G, 2016, A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support, Proc. euspen 16th Intl. Conf., Nottingham UK, 30 May – 3 June
  • El Gawhary O, 2017, Helmholtz Natural Modes: the universal and discrete spatial fabric of electromagnetic wavefields, New J. Phys. (at press); DOI: 10.1088/1367-2630/aa57c3

For details of planned work, please see the Project page.