• Madsen MH et al. 2016 Alignment free characterization of 2D gratings Applied Optics 55 317-322
  • Madsen M and Hansen P, 2016, Scatterometry — fast and robust measurements of nano-textured surfaces, Surface Topography: Metrology and Properties4, 023003
  • Madsen M, Boher P, Hansen P and Jørgensen J, 2016, Alignment-free characterization of 2D gratings, Applied Optics, 55, 317
  • Madsen JS, Hansen P-E, Bilenberg B, Nygård J and Madsen MH, 2016, Measuring multiple nano-textured areas simultaneously with imaging scatterometry, Proc. euspen 16th Intl. Conf., Nottingham, UK, 30 May – 3 June
  • Jones C, Santiano M, Downes S, Bellotti R, O’Connor D and Picotto G, 2016, A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support, Proc. euspen 16th Intl. Conf., Nottingham UK, 30 May – 3 June
  • Madsen MH et al. 2016 Comparison of Scatterometry, Imaging Scatterometry, AFM and Confocal Microscopy Proc. 4M/IWMF, Kgs. Lyngby, DK, 13–15 September
  • Madsen MH et al. 2016 User Friendly Scatterometry Proc. EOSAM, Berlin, DE, September
  • El Gawhary O, 2017, Helmholtz Natural Modes: the universal and discrete spatial fabric of electromagnetic wavefields, New J. Phys. (at press); DOI: 10.1088/1367-2630/aa57c3
  • Kouko J et al. 2017 Measurement of Thermoplastic Properties of Packaging Materials Proc. IAPRI 28th Symposium on Packaging, Lausanne, CH, 9 – 12 May


For details of planned work, please see the Objectives page.